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LibGPIB::HCStress Class Reference

#include <HCStress.h>

List of all members.

Public Methods
	HCStress (HP4156A& hp4156a, MOSConnection& connection)
	Default constructor.
void	Stress (float duration)
	Stress the device for the specified duration using the current setting of the stress biases. More...
void	Characterize ()
	Characterize the device using the registered set of characterization tests.
void	AddCharacterization (Characterization *char_test)
	Add the specified characterization experiment to the list of tests that will be performed when Characterize() is called. More...
void	RemoveCharacterization (Characterization *char_test)
	Remove the specified characterization experiment to the list of tests that will be performed when Characterize() is called. More...
void	StressBias (int terminal, float bias)
	Specify the stress bias that will be applied to a given terminal.
virtual	~HCStress ()
	Destructor.
Private Types
typedef vector<Characterization *>	CharVec
	The set of characterization experiments which are registered with this stress experiment.
Private Attributes
MOSConnection&	mConnection
	A connection matrix which specifies how the various device terminals are connected to the SMUs of the HP4156A.
HP4156A&	mHP4156A
	The parameter analyzer which will be used to do all the tests.
float	mStressBias [MOSConnection::TERMINALS]
	The stress biases.
CharVec	mCharacterization

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Member Typedef Documentation

typedef vector<Characterization *> LibGPIB::HCStress::CharVec [private]

The set of characterization experiments which are registered with this stress experiment.

Definition at line 84 of file HCStress.h.

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Constructor & Destructor Documentation

LibGPIB::HCStress::HCStress ( HP4156A & hp4156a, MOSConnection & connection ) [inline]

Default constructor.

Definition at line 90 of file HCStress.h.

LibGPIB::HCStress::~HCStress ( ) [inline, virtual]

Destructor.

Definition at line 142 of file HCStress.h.

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Member Function Documentation

void LibGPIB::HCStress::AddCharacterization ( Characterization * char_test ) [inline]

Add the specified characterization experiment to the list of tests that will be performed when Characterize() is called.

The same test can be added to the list multiple times and it will be performed as many times.

Definition at line 121 of file HCStress.h.

void LibGPIB::HCStress::Characterize ( ) [inline]

Characterize the device using the registered set of characterization tests.

Definition at line 113 of file HCStress.h.

void LibGPIB::HCStress::RemoveCharacterization ( Characterization * char_test ) [inline]

Remove the specified characterization experiment to the list of tests that will be performed when Characterize() is called.

:TRICKY: If a test has been added to the list multiple times, all the occurrences of that test will be removed.

Definition at line 127 of file HCStress.h.

void LibGPIB::HCStress::Stress ( float duration )

Stress the device for the specified duration using the current setting of the stress biases.

The duration is specified in seconds.

void LibGPIB::HCStress::StressBias ( int terminal, float bias ) [inline]

Specify the stress bias that will be applied to a given terminal.

Definition at line 138 of file HCStress.h.

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Member Data Documentation

CharVec LibGPIB::HCStress::mCharacterization [private]

Definition at line 85 of file HCStress.h.

MOSConnection & LibGPIB::HCStress::mConnection [private]

A connection matrix which specifies how the various device terminals are connected to the SMUs of the HP4156A.

Definition at line 69 of file HCStress.h.

HP4156A & LibGPIB::HCStress::mHP4156A [private]

The parameter analyzer which will be used to do all the tests.

Definition at line 74 of file HCStress.h.

float LibGPIB::HCStress::mStressBias[MOSConnection::TERMINALS] [private]

The stress biases.

Definition at line 78 of file HCStress.h.

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The documentation for this class was generated from the following file:

• HCStress.h

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